Events

Pieter Peers, Tim Weyrich, Wojciech Matusik, Szymon Rusinkiewicz: “Fabricating Microgeometry for Custom Surface Reflectance”

August 4, 2009 | New Orleans, LA

Speaker: Pieter Peers, Tim Weyrich, Wojciech Matusik, Szymon Rusinkiewicz
Host: ACM SIGGRAPH 2009

We propose a system for manufacturing physical surfaces that, in aggregate, exhibit a desired surface appearance. Our system begins with a user specification of a BRDF, or simply a highlight shape, and infers the required distribution of surface slopes. We sample this distribution, optimize for a maximally-continuous and valley-minimizing height field, and finally mill the surface using a computer-controlled machine tool. We demonstrate a variety of surfaces, ranging from reproductions of measured BRDFs to materials with unconventional highlights.