Abhijeet Ghosh: “Measurement and Modeling of Detailed Facial Reflectance”

November 30, 2012 | Singapore

Speaker: Abhijeet Ghosh
Host: SIGGRAPH Asia 2012

Abstract: We present a set of new techniques for practical acquisition and modeling of detailed facial reflectance including separation of individual reflectance components and fitting measured data to appropriate reflectance and scattering models. We also describe a novel computational illumination approach based on measuring the second order statistics of surface reflectance that provides direct estimates of spatially varying specular roughness.